71![Stretchable Electronics: Stretchable InorganicSemiconductor Electronic Systems (Adv. Mater) Stretchable Electronics: Stretchable InorganicSemiconductor Electronic Systems (Adv. Mater)](https://www.pdfsearch.io/img/b87c0f63ed80bc253cf38c77931faec7.jpg) | Add to Reading ListSource URL: rogers.matse.illinois.eduLanguage: English - Date: 2011-07-08 11:04:37
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72![Flash Memory Summit Keynotes Capture All Major Trends in Non-Volatile Memory SANTA CLARA, CA – June 15, 2016 – Flash Memory Summit (FMS) keynotes will open attendees’ eyes to the latest and most important trends in Flash Memory Summit Keynotes Capture All Major Trends in Non-Volatile Memory SANTA CLARA, CA – June 15, 2016 – Flash Memory Summit (FMS) keynotes will open attendees’ eyes to the latest and most important trends in](https://www.pdfsearch.io/img/6074a4f8f54271f9a9dd332f4c55c25e.jpg) | Add to Reading ListSource URL: www.flashmemorysummit.comLanguage: English - Date: 2016-06-15 12:49:07
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73![NVDIMM Block Window Driver Writer’s Guide Example NFIT-Based NVDIMM Block Window and Persistent Memory Interface Guide April July 20165 NVDIMM Block Window Driver Writer’s Guide Example NFIT-Based NVDIMM Block Window and Persistent Memory Interface Guide April July 20165](https://www.pdfsearch.io/img/ec38920f82066dd6030e611ee74532f1.jpg) | Add to Reading ListSource URL: pmem.ioLanguage: English - Date: 2016-08-17 10:14:52
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74![hyrise_nvm_architecture_poster hyrise_nvm_architecture_poster](https://www.pdfsearch.io/img/e229b26954d01b80a0a6d9c50a293a7a.jpg) | Add to Reading ListSource URL: acmsocc.github.ioLanguage: English - Date: 2016-02-21 03:10:50
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75![HexPADS: a platform to detect “stealth” attacks Mathias Payer Purdue University Abstract. Current systems are under constant attack from many different sources. Both local and remote attackers try to escalate their p HexPADS: a platform to detect “stealth” attacks Mathias Payer Purdue University Abstract. Current systems are under constant attack from many different sources. Both local and remote attackers try to escalate their p](https://www.pdfsearch.io/img/f891e7c37169ecff1df1a9ca87f783d9.jpg) | Add to Reading ListSource URL: hexhive.github.ioLanguage: English - Date: 2016-06-13 11:08:40
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76![Is Memory Disaggregation Feasible? A Case Study with Spark SQL Pramod Subba Rao and George Porter UC San Diego Abstract Is Memory Disaggregation Feasible? A Case Study with Spark SQL Pramod Subba Rao and George Porter UC San Diego Abstract](https://www.pdfsearch.io/img/52963b552bae159c0ad6a3115b231a0d.jpg) | Add to Reading ListSource URL: cseweb.ucsd.eduLanguage: English - Date: 2016-01-17 15:09:27
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77![Advanced
x86:
BIOS
and
System
Management
Mode
Internals
SMM
&
Caching
Xeno
Kovah
&&
Corey
Kallenberg
LegbaCore,
LLC
Advanced
x86:
BIOS
and
System
Management
Mode
Internals
SMM
&
Caching
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Kovah
&&
Corey
Kallenberg
LegbaCore,
LLC](https://www.pdfsearch.io/img/f20994fbe29e606637694da3d1dc2a47.jpg) | Add to Reading ListSource URL: opensecuritytraining.infoLanguage: English - Date: 2015-10-14 22:08:56
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78![Advanced
x86:
BIOS
and
System
Management
Mode
Internals
Memory
Map
Xeno
Kovah
&&
Corey
Kallenberg
LegbaCore,
LLC
Advanced
x86:
BIOS
and
System
Management
Mode
Internals
Memory
Map
Xeno
Kovah
&&
Corey
Kallenberg
LegbaCore,
LLC](https://www.pdfsearch.io/img/9086a8fe7e81c41f4eb533a63de6f119.jpg) | Add to Reading ListSource URL: opensecuritytraining.infoLanguage: English - Date: 2015-10-14 22:09:41
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79![NTE2114 Integrated Circuit MOS, Static 4K RAM, 300ns Description: The NTE2114 1024–word 4–bit static random access memory is fabricated using N–channel silicon– gate technology. All internal circuits are fully st NTE2114 Integrated Circuit MOS, Static 4K RAM, 300ns Description: The NTE2114 1024–word 4–bit static random access memory is fabricated using N–channel silicon– gate technology. All internal circuits are fully st](https://www.pdfsearch.io/img/50ff32b745f370b3a5ac95911337e0fd.jpg) | Add to Reading ListSource URL: www.downloads.reactivemicro.comLanguage: English - Date: 2008-02-09 13:46:29
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80![Understanding and Mitigating Refresh Overheads in High-Density DDR4 DRAM Systems Janani Mukundan Hillery Hunter Understanding and Mitigating Refresh Overheads in High-Density DDR4 DRAM Systems Janani Mukundan Hillery Hunter](https://www.pdfsearch.io/img/53420d5090b66d24899936ec659f02ef.jpg) | Add to Reading ListSource URL: www.csl.cornell.eduLanguage: English - Date: 2013-07-11 15:30:35
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